Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures

• Florian Pielmeier,
• Daniel Meuer,
• Daniel Schmid,
• Christoph Strunk and
• Franz J. Giessibl

Beilstein J. Nanotechnol. 2014, 5, 407–412, doi:10.3762/bjnano.5.48